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Advanced Scanning Electron Microscopy and X-Ray Microanalysis
Advanced Scanning Electron Microscopy and X-Ray Microanalysis
Author: Patrick Echlin, C.E. Fiori, Joseph Goldstein, David C. Joy, Dale E. Newbury
ISBN-13: 9780306421402
ISBN-10: 0306421402
Publication Date: 3/31/1986
Pages: 466
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Publisher: Plenum US
Book Type: Hardcover
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