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Advanced Scanning Electron Microscopy and X-Ray Microanalysis
Advanced Scanning Electron Microscopy and XRay Microanalysis
Author: Patrick Echlin, C.E. Fiori, Joseph Goldstein, David C. Joy, Dale E. Newbury
ISBN-13: 9781475790290
ISBN-10: 1475790295
Publication Date: 11/20/2013
Pages: 454
Edition: Softcover reprint of
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Publisher: Springer
Book Type: Paperback
Other Versions: Hardcover
Members Wishing: 0
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