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Fault-Tolerance and Reliability Techniques for High-Density Random-Access Memories (Prentice Hall Modern Semiconductor Design Series)
FaultTolerance and Reliability Techniques for HighDensity RandomAccess Memories - Prentice Hall Modern Semiconductor Design Series
Author: Kanad Chakraborty, Pinaki Mazumder
This book deals with primarily with reliable and faul-tolerant circuit design and evaluation techniques for RAMS. It examines both the manufacturing faul-tolerance (e.g. self-repair at the time of manufacturing) and online and field-related fault-tolerance (e.g. error-correction). It talks a lot about important techniques and requirements, and e...  more »
ISBN-13: 9780130084651
ISBN-10: 0130084654
Publication Date: 6/10/2002
Pages: 448
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Publisher: Prentice Hall PTR
Book Type: Hardcover
Members Wishing: 0
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