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Reflection Electron Microscopy and Spectroscopy for Surface Analysis
Reflection Electron Microscopy and Spectroscopy for Surface Analysis
Author: Zhong Lin Wang
This book is a comprehensive review of the theories, techniques and applications of reflection electron microscopy (REM), reflection high-energy electron diffraction (RHEED) and reflection electron energy-loss spectroscopy (REELS). The book is divided into three parts: diffraction, imaging and spectroscopy. The text is written to combine basic ...  more »
ISBN-13: 9780521482660
ISBN-10: 0521482666
Publication Date: 5/31/1996
Pages: 456
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Publisher: Cambridge University Press
Book Type: Hardcover
Other Versions: Paperback
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