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Semiconductor Thermal Measurement and Management Symposium (Semi-Therm), 1998 IEEE
Semiconductor Thermal Measurement and Management Symposium 1998 IEEE - Semi-Therm
Author: IEEE Components Packaging & Manufacturin, IEEE
These papers are the forum for presenting new developments in and applications relating to generation and removal of heat within semiconductor devices and the measurement of junction temperatures under various applications and environmental conditions. Thermal characterization of electronic parts, the modeling and analysis, and measurement of co...  more »
ISBN-13: 9780780344860
ISBN-10: 0780344863
Pages: 257
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Publisher: Institute of Electrical & Electronics Enginee
Book Type: Paperback
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