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Testing and Testable Design of High-Density Random-Access Memories (Frontiers in Electronic Testing)
Testing and Testable Design of HighDensity RandomAccess Memories - Frontiers in Electronic Testing
Author: Pinaki Mazumder, Kanad Chakraborty
Testing and Testable Design of High-Density Random-Access Memories deals with the study of fault modeling, testing and testable design of semiconductor random-access memories. It is written primarily for the practising design engineer and the manufacturer of random-access memories (RAMs) of the modern age. It provides useful exposure to sta...  more »
ISBN-13: 9780792397823
ISBN-10: 0792397827
Publication Date: 9/30/1996
Pages: 424
Edition: 1st
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Publisher: Springer
Book Type: Hardcover
Members Wishing: 0
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