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Fundamentals of Nanoscale Film Analysis
Fundamentals of Nanoscale Film Analysis
Author: Terry L. Alford, L.C. Feldman, James W. Mayer
From materials science to integrated circuit development, much of modern technology is moving from the microscale toward the nanoscale. This book focuses on the fundamental physics underlying innovative techniques for analyzing surfaces and near-surfaces. New analytical techniques have emerged to meet these technological requirements, all based ...  more »
ISBN-13: 9781441939807
ISBN-10: 1441939806
Publication Date: 10/29/2010
Pages: 336
Edition: Softcover reprint of
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Publisher: Springer
Book Type: Paperback
Other Versions: Hardcover
Members Wishing: 0
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