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1998 1st International Conference on Integrated Circuits Yield
1998 1st International Conference on Integrated Circuits Yield
Author: IEEE Electron Devices Society
This conference provides a forum for the presentations in the field of IC yield. One of the unique features of this conference is that it has combined exciting new academic research with state-of-the-art industrial data, necessary ingredients for significant advances in this field. All aspects of design, manufacturing and test which affect yield...  more »
ISBN-13: 9780780343870
ISBN-10: 0780343875
Publication Date: 12/1998
Pages: 60
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Publisher: Institute of Electrical Electronics Enginee
Book Type: Paperback
Members Wishing: 0
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