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Search - 1999 IEEE International Symposium on Defect and Fault Tolerance in Vlsi Systems (Dft '99): November 1-3, 1999 Albuquerque, New Mexico: Proceedings

1999 IEEE International Symposium on Defect and Fault Tolerance in Vlsi Systems (Dft '99): November 1-3, 1999 Albuquerque, New Mexico: Proceedings
1999 IEEE International Symposium on Defect and Fault Tolerance in Vlsi Systems November 13 1999 Albuquerque New Mexico Proceedings - Dft '99
Author: IEEE Computer Society, IEEE
These proceedings cover: yield; testing techniques; built-in self-test architectures; fault modelling and simulation; design for testing; self-checking processing units and systems; self-checking memories and interconnections; diagnosis; and reconfiguration.
ISBN-13: 9780769503257
ISBN-10: 076950325X
Pages: 375
Edition: 1999
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Publisher: Institute of Electrical & Electronics Enginee
Book Type: Paperback
Members Wishing: 0
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