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Developments in the Use of Failure Rate Data and Reliability Prediction Methods for Hardware
Developments in the Use of Failure Rate Data and Reliability Prediction Methods for Hardware
Author: David John Smith
ISBN-13: 9780951656266
ISBN-10: 0951656260
Publication Date: 1/1/2000
Pages: 180
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Publisher: Technis
Book Type: Paperback
Members Wishing: 0
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