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Dielectric Breakdown in Gigascale Electronics: Time Dependent Failure Mechanisms (SpringerBriefs in Materials)
Dielectric Breakdown in Gigascale Electronics Time Dependent Failure Mechanisms - SpringerBriefs in Materials
Author: Juan Pablo Borja, Toh-Ming Lu, Joel Plawsky
This book focuses on the experimental and theoretical aspects of the time-dependent breakdown of advanced dielectric films used in gigascale electronics. Coverage includes the most important failure mechanisms for thin low-k films, new and established experimental techniques, recent advances in the area of dielectric failure, and advanced simula...  more »
ISBN-13: 9783319432182
ISBN-10: 3319432184
Publication Date: 9/26/2016
Pages: 105
Edition: 1st ed. 2016
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Publisher: Springer
Book Type: Paperback
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