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Electromigration and Electronic Device Degradation
Electromigration and Electronic Device Degradation
Addresses electromigration failure modes in electronics covering both theory and experiments. Reviews silicon and GaAs technologies. Various rate controlling details are summarized including an investigation of temperature dependence. Concludes with a discussion regarding current status and future plans for electromigration resistant advanced me...  more »
ISBN-13: 9780471584896
ISBN-10: 0471584894
Publication Date: 12/1993
Pages: 343
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Publisher: Wiley-Interscience
Book Type: Hardcover
Members Wishing: 0
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