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Electron Microprobe Analysis and Scanning Electron Microscopy in Geology
Electron Microprobe Analysis and Scanning Electron Microscopy in Geology
Author: S. J. B. Reed
Now fully updated to cover recent developments, this book covers the closely related techniques of electron microprobe analysis (EMPA) and scanning electron microscopy (SEM) specifically from a geological viewpoint. Topics discussed include: principles of electron-target interactions, electron beam instrumentation, X-ray spectrometry, general pr...  more »
ISBN-13: 9780521848756
ISBN-10: 052184875X
Publication Date: 5/1/2006
Pages: 250
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Publisher: Cambridge University Press
Book Type: Hardcover
Other Versions: Paperback
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