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Hierarchical Modeling for VLSI Circuit Testing (The Kluwer International Series in Engineering and Computer Science)
Hierarchical Modeling for VLSI Circuit Testing - The Kluwer International Series in Engineering and Computer Science
Author: Debashis Bhattacharya, John P. Hayes
ISBN-13: 9780792390589
ISBN-10: 079239058X
Publication Date: 12/31/1989
Pages: 176
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Publisher: Springer
Book Type: Hardcover
Members Wishing: 0
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