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Introduction to Sims for Surface and Thin Film Analysis
Introduction to Sims for Surface and Thin Film Analysis
Author: J. F Watts
The book provides a basic introduction to SIMS, covering both the science behind the subject, and the instrumentation and techniques available. Following a scene-setting introduction, the process of sputtering and ion formation is covered in Chapter 2. Instrumentation, analytical applications, techniques and data processing are covered in the fo...  more »
ISBN-13: 9780470091333
ISBN-10: 0470091339
Publication Date: 7/6/2007
Pages: 256
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Publisher: Wiley-Blackwell (an imprint of John Wiley & Sons Ltd)
Book Type: Paperback
Other Versions: Hardcover
Members Wishing: 0
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