Skip to main content
PBS logo
 
 

Search - Itc-International Test Conference, 1999

Itc-International Test Conference, 1999
ItcInternational Test Conference 1999
Author: IEEE
The proceedings of the 1999 IEEE Test Conference contain papers on various aspects of designing and testing computer hardware. Topics addressed include: MCM and known-good-die testing; analogue test methods; production wafer testing; and diagnosis of integrated-circuit process defects.
ISBN-13: 9780780357563
ISBN-10: 0780357566
Rating:
  ?
0 stars, based on 0 rating
Publisher: Ieee
Book Type: Hardcover
Members Wishing: 0
Reviews: Amazon | Write a Review



Back to the Top ↑
By using this Web site, you confirm that you have read, understood, and agreed to be bound by the Terms of Use. As an Amazon Associate we earn from qualifying purchases.
US Patent Number 7,877,315 | Copyright © 2004 - 2024 PaperBackSwap.com. All Rights Reserved.