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Journey to Data Quality
Journey to Data Quality
Author: Yang W. Lee, Leo L. Pipino, James D. Funk, Richard Y. Wang
All organizations today confront data quality problems, both systemic and structural. Neither ad hoc approaches nor fixes at the systems level?installing the latest software or developing an expensive data warehouse?solve the basic problem of bad data quality practices. Journey to Data Quality offers a roadmap that can be used by practiti...  more »
ISBN-13: 9780262122870
ISBN-10: 0262122871
Publication Date: 10/1/2006
Pages: 240
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Publisher: The MIT Press
Book Type: Hardcover
Other Versions: Paperback
Members Wishing: 0
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