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Light-Element Analysis in the Transmission Electron Microscope: WEDX and EELS (Royal Microscopy Society Microscopy Handbooks, No 16)
LightElement Analysis in the Transmission Electron Microscope WEDX and EELS - Royal Microscopy Society Microscopy Handbooks, No 16
Author: P. M. Budd, Peter J. Goodhew
Emphasizing practical application over theory, this book explains in simple terms the two major techniques by which analysis of very light elements using the transmission electron microscope (TEM) is performed: x-ray analysis without a window (WEDX) and electron energy loss spectroscopy (EELS). Readers familiar with the TEM will quickly learn ho...  more »
ISBN-13: 9780198564171
ISBN-10: 0198564171
Publication Date: 6/9/1988
Pages: 80
Edition: illustrated edition
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Publisher: Oxford University Press, USA
Book Type: Paperback
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Royal Microscopy Society Microscopy Handbooks  16 of 16

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