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Nanometer Variation-Tolerant SRAM: Circuits and Statistical Design for Yield
Nanometer VariationTolerant SRAM Circuits and Statistical Design for Yield
Author: Mohamed H. Abu-Rahma, Mohab Anis
Variability is one of the most challenging obstacles for IC design in the nanometer regime.  In nanometer technologies, SRAM show an increased sensitivity to process variations due to low-voltage operation requirements, which are aggravated by the strong demand for lower power consumption and cost, while achieving higher performance and density....  more »
ISBN-13: 9781461417484
ISBN-10: 1461417481
Publication Date: 9/27/2012
Pages: 186
Edition: 2013
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Publisher: Springer
Book Type: Hardcover
Members Wishing: 0
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