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Proceedings of the 10th International Symposium on the Physical & Failure Analysis of Integrated Circuits: Ipfa 2003: [Scheduled, 7 to 11 July, 2003,
Proceedings of the 10th International Symposium on the Physical Failure Analysis of Integrated Circuits Ipfa 2003 Scheduled 7 to 11 July 2003
Author: IEEE
This text covers topics on: advanced failure analysis techniques; advanced interconnects; dielectrics and hot-carrier reliabilty; EOS/ESD and CMOS latchup; practical issues in building-in reliability; and reliability and failure analysis in specialist devices.
ISBN-13: 9780780377226
ISBN-10: 0780377222
Pages: 220
Edition: illustrated edition
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Publisher: Institute of Electrical & Electronics Enginee
Book Type: Hardcover
Members Wishing: 0
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