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Reliability, Yield, and Stress Burn-In: A Unified Approach for Microelectronics Systems Manufacturing and Software Development
Reliability Yield and Stress BurnIn A Unified Approach for Microelectronics Systems Manufacturing and Software Development
Author: Way Kuo, Wei-Ting Kary Chien, Taeho Kim
Reliability, Yield, and Stress Burn-In explains reliability issues in Microelectronics Systems Manufacturing and Software Development with an emphasis on evolving manufacturing technology for the semiconductor industry. Since most microelectronics components have an infant mortality period of about one year under ordinary operating conditio...  more »
ISBN-13: 9780792381075
ISBN-10: 0792381076
Publication Date: 1/31/1998
Pages: 424
Edition: 1st
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Publisher: Springer
Book Type: Hardcover
Members Wishing: 0
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