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Semiconductor Memories : Technology, Testing, and Reliability
Semiconductor Memories Technology Testing and Reliability
Author: Ashok K. Sharma
Semiconductor Memories provides in-depth coverage in the areas of design for testing, fault tolerance, failure modes and mechanisms, and screening and qualification methods including. — * Memory cell structures and fabrication technologies. — * Application-specific memories and architectures. — * Memory design, fault modeling and test algorithms, l...  more »
ISBN-13: 9780780310001
ISBN-10: 0780310004
Publication Date: 9/9/2002
Pages: 480
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Publisher: Wiley-IEEE Press
Book Type: Hardcover
Members Wishing: 0
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