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Semiconductor Thermal Measurement & Management (Semi-Therm), 18th Symposium
Semiconductor Thermal Measurement Management 18th Symposium - Semi-Therm
Author: IEEE Electron Devices Society
This volume originates from the 18th Symposium on Semiconductor Thermal Measurement and Management and examines components. It covers topics including: advances in compact models; package and material characterization; system level analysis; and liquid cooling application.
ISBN-13: 9780780373273
ISBN-10: 0780373278
Pages: 210
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Publisher: Ieee
Book Type: Paperback
Other Versions: Hardcover
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