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System-on-Chip Test Architectures (Systems on Silicon)
SystemonChip Test Architectures - Systems on Silicon
Author: Wang
Modern electronics testing has a legacy of more than 40 years. The introduction of new technologies, especially nanometer technologies with 90nm or smaller geometry, has allowed the semiconductor industry to keep pace with the increased performance-capacity demands from consumers. As a result, semiconductor test costs have been growing steadily...  more »
ISBN-13: 9780123739735
ISBN-10: 012373973X
Publication Date: 11/16/2007
Pages: 896
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Publisher: Morgan Kaufmann
Book Type: Hardcover
Members Wishing: 0
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