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Search - 1998 International Integrated Reliability Workshop Final Report: Stanford Sierra Camp Lake Tahoe, California October 12-15, 1998

1998 International Integrated Reliability Workshop Final Report: Stanford Sierra Camp Lake Tahoe, California October 12-15, 1998
1998 International Integrated Reliability Workshop Final Report Stanford Sierra Camp Lake Tahoe California October 1215 1998
Author: IEEE Reliability Society, IEEE
The International Integrated Reliability Workshop provides a forum for sharing new approaches to achieve and maintain microelectronic component reliability. Topics include: contributors to failure; waver level reliability; building in reliability; and reliability test structures.
ISBN-13: 9780780348813
ISBN-10: 0780348818
Pages: 176
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Publisher: Institute of Electrical & Electronics Enginee
Book Type: Paperback
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