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Atomic Force Microscopy
Atomic Force Microscopy
Author: Peter Eaton, Paul West
Atomic force microscopy is an amazing technique that allies a versatile methodology (that allows measurement of samples in liquid, vacuum or air) to imaging with unprecedented resolution. But it goes one step further than conventional microscopic techniques; it allows us to make measurements of magnetic, electrical or mechanical properties of th...  more »
ISBN-13: 9780199570454
ISBN-10: 0199570450
Publication Date: 5/20/2010
Pages: 288
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Publisher: Oxford University Press, USA
Book Type: Hardcover
Members Wishing: 0
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