2013 - Electromigration Modeling at Circuit Layout Level [SpringerBriefs in Applied Sciences and Technology / SpringerBriefs in Reliability] (Paperback) ISBN-13: 9789814451208 ISBN-10: 9814451207 Genres: Science & Math, Engineering & Transportation ? 2011 - Applications of Finite Element Methods for Reliability Studies on Ulsi Interconnections [Springer Series in Reliability Engineering] (Hardcover) ISBN-13: 9780857293091 ISBN-10: 0857293095 Genres: Science & Math, Engineering & Transportation ? 2010 - Electromigration in Ulsi Interconnections [International Series on Advances in Solid State Electronics and Technology] (Hardcover) ISBN-13: 9789814273329 ISBN-10: 9814273325 Genre: Engineering & Transportation ? |