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Search - Fundamental Principles of Engineering Nanometrology (Micro and Nano Technologies)

Fundamental Principles of Engineering Nanometrology - Micro and Nano Technologies
Author: Richard Leach

The principles of engineering metrology applied to the micro- and nanoscale: essential reading for all scientists and engineers involved in the commercialisation of nanotechnology and measurement processes requiring accuracy at the nanoscale. — The establishment of common standards will be an essential key to unlocking the commercial potential of... more » Micro- and Nanotechnologies (MNT), enabling fabrication plants to interchange parts, packaging and design rules. Effectively MNT standardization will provide the micro- and nanoscale equivalents of macro-scale nuts and bolts or house bricks. Currently there is a major thrust for standardization of MNT activities, with committees of the ISO, IEC and numerous national and regional committees being set up.

In this book Professor Richard Leach, of the UK's National Physical Laboratory (NPL) makes a significant contribution to standardization in the field of MNT, extending the principles of engineering metrology to the micro- and nanoscale, with a focus on dimensional and mass metrology. The principles and techniques covered in this book form the essential toolkit for scientists and engineers involved in the commercialisation of nanotechnology and measurement processes requiring accuracy at the nanoscale.

Key topics covered include:

Basic metrological terminology, and the highly important topic of measurement uncertainty.
Instrumentation, including an introduction to the laser
Measurement of length using optical interferometry, including gauge block interferometry
Displacement measurement and sensors
Surface texture measurement, stylus, optical and scanning probe instruments, calibration, profile and areal characterisation
Coordinate metrology
Low mass and force metrology

About the Author

Professor Richard Leach is a Principal Research Scientist in the Mass & Dimensional Group, Engineering Measurement Division at the National Physical Laboratory (NPL), UK.

Provides a basic introduction to measurement and instruments
Thoroughly presents numerous measurement techniques, from static length and displacement to surface topography, mass and force
Covers multiple optical surface measuring instruments and related topics (interferometry, triangulation, confocal , variable focus, and scattering instruments)
Explains, in depth, the calibration of surface topography measuring instruments (traceability; calibration of profile and areal surface texture measuring instruments; uncertainties)
Discusses the material in a way that is comprehensible to even those with only a limited mathematical knowledge

ISBN-13: 9780080964546
ISBN-10: 0080964540
Publication Date: 10/9/2009
Pages: 352
Rating:

0 stars, based on 0 rating

Publisher: William Andrew
Book Type: Hardcover
Members Wishing: 0
Reviews: Amazon | Write a Review

Genres:

Science & Math >> Earth Sciences >> Environmental Science

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