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Fundamental Principles of Engineering Nanometrology, Second Edition (Micro and Nano Technologies)
Fundamental Principles of Engineering Nanometrology Second Edition - Micro and Nano Technologies
Author: Richard Leach
Working at the nano-scale demands an understanding of the high-precision measurement techniques that make nanotechnology and advanced manufacturing possible. This new edition of Fundamental Principles of Engineering Nanometrology provides a road map and toolkit for metrologists engaging with the rigor of measurement and data analysis at the nano...  more »
ISBN-13: 9781455777532
ISBN-10: 1455777536
Publication Date: 6/15/2014
Pages: 400
Edition: 2
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Publisher: William Andrew
Book Type: Hardcover
Members Wishing: 0
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