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Helium Ion Microscopy: Principles and Applications (SpringerBriefs in Materials)
Helium Ion Microscopy Principles and Applications - SpringerBriefs in Materials
Author: David C. Joy
Helium Ion Microscopy: Principles and Applications describes the theory and discusses the practical details of why scanning microscopes using beams of light ions ? such as the Helium Ion Microscope (HIM) ? are destined to become the imaging tools of choice for the 21st century. Topics covered include the principles, operation, and performance of...  more »
ISBN-13: 9781461486596
ISBN-10: 1461486599
Publication Date: 9/24/2013
Pages: 70
Edition: 2013
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Publisher: Springer
Book Type: Paperback
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