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Hot-Carrier Reliability of MOS VLSI Circuits (The Springer International Series in Engineering and Computer Science)
HotCarrier Reliability of MOS VLSI Circuits - The Springer International Series in Engineering and Computer Science
Author: Yusuf Leblebici, Sung-Mo (Steve) Kang
This volume addresses the issues related to hot-carrier reliability of MOS VLSI circuits, ranging from device physics to circuit design guidelines. It presents a unified view of the physical mechanisms involved in hot-carrier induced device degradation, the prevalent models for these mechanisms, and simulation methods for estimating hot-carrier ...  more »
ISBN-13: 9780792393528
ISBN-10: 079239352X
Publication Date: 6/30/1993
Pages: 236
Edition: 1st
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Publisher: Springer
Book Type: Hardcover
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