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IEEE International Test Conference 2001
IEEE International Test Conference 2001
Author: IEEE
Topics covered include: beyond DC testing at board test; BIST medley; how can we improve IDDQ testing of DSM/VDSM; practical experience with SOC testing; problems for ATE software; lecture series test and repair of large embedded DRAMs; DFT innovations; and novel techniques of fault diagnosis.
ISBN-13: 9780780371699
ISBN-10: 0780371690
Publication Date: 11/30/2001
Pages: 1,158
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Publisher: I.E.E.E.Press
Book Type: Hardcover
Members Wishing: 0
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