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Monte Carlo Modeling for Electron Microscopy and Microanalysis (Oxford Series in Optical and Imaging Sciences)
Monte Carlo Modeling for Electron Microscopy and Microanalysis - Oxford Series in Optical and Imaging Sciences
Author: David C. Joy
This book describes for the first time how Monte Carlo modeling methods can be applied to electron microscopy and microanalysis. Computer programs for two basic types of Monte Carlo simulation are developed from physical models of the electron scattering process--a single scattering program capable of high accuracy but requiring long computation...  more »
ISBN-13: 9780195088748
ISBN-10: 0195088743
Publication Date: 4/13/1995
Pages: 224
Edition: annotated edition
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Publisher: Oxford University Press, USA
Book Type: Hardcover
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