Skip to main content
PBS logo
 
 

Search - Point Defects in Semiconductors and Insulators

Point Defects in Semiconductors and Insulators
Point Defects in Semiconductors and Insulators
Author: Johann-Martin Spaeth, Harald Overhof
POINT DEFECTS IN SEMICONDUCTORS AND INSULATORS introduces the principles and techniques of modern electron paramagnetic resonance (EPR) spectroscopy that are essential for determining microscopic defect structures. Many different magnetic resonance methods are required to investigate the microscopic and electronic properties of solids and uncove...  more »
ISBN-13: 9783540426950
ISBN-10: 3540426957
Publication Date: 4/10/2003
Pages: 490
Edition: 1
Rating:
  ?
0 stars, based on 0 rating
Publisher: Springer
Book Type: Hardcover
Members Wishing: 0
Reviews: Amazon | Write a Review



Back to the Top ↑
By using this Web site, you confirm that you have read, understood, and agreed to be bound by the Terms of Use. As an Amazon Associate we earn from qualifying purchases.
US Patent Number 7,877,315 | Copyright © 2004 - 2024 PaperBackSwap.com. All Rights Reserved.