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Quiescent Current Testing of CMOS Data Converters: Design, Fabrication and Testing
Quiescent Current Testing of CMOS Data Converters Design Fabrication and Testing
Author: SIVA YELLAMPALLI
Power supply quiescent current (IDDQ) testing has been very effective in detecting physical defects such as open, short and bridging defects in VLSI circuits designed in CMOS processes. However, in sub-micron VLSI circuits, IDDQ current is masked by the increased subthreshold (leakage) current of MOSFETs affecting the efficiency of IDDQ te...  more »
ISBN-13: 9783836495172
ISBN-10: 3836495171
Publication Date: 2/5/2009
Pages: 116
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Publisher: VDM Verlag Dr. Müller
Book Type: Paperback
Members Wishing: 0
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