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Scanning Electron Microscopy and X-ray Microanalysis: Third Edition
Scanning Electron Microscopy and X-ray Microanalysis Third Edition
Author: Joseph Goldstein, Dale E. Newbury, David C. Joy, Charles E. Lyman, Patrick Echlin, Eric Lifshin, Linda Sawyer, J.R. Michael
This text provides students as well as practitioners with a comprehensive introduction to the field of scanning electron microscopy (SEM) and X-ray microanalysis. The authors emphasize the practical aspects of the techniques described. Topics discussed include user-controlled functions of scanning electron microscopes and x-ray spectrometers and...  more »
ISBN-13: 9781461349693
ISBN-10: 1461349699
Publication Date: 5/31/2013
Pages: 689
Edition: 3rd ed. 2003. Softco
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Publisher: Springer
Book Type: Paperback
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