Skip to main content
PBS logo
 
 

Search - Scanning Force Microscopy: With Applications to Electric, Magnetic, and Atomic Forces (Oxford Series on Optical Sciences)

Scanning Force Microscopy: With Applications to Electric, Magnetic, and Atomic Forces (Oxford Series on Optical Sciences)
Scanning Force Microscopy With Applications to Electric Magnetic and Atomic Forces - Oxford Series on Optical Sciences
Author: Dror Sarid
Scanning tunneling microscopy (STM), invented by Binnig and Rohrer in 1982, enables one to obtain images reflecting surface electronic structure with atomic resolution. As an offshoot of this technology, Binnig, Quate and Gerber in 1986 invented atomic force microscopy (AFM), also capable of achieving atomic resolution. By now this technology pr...  more »
ISBN-13: 9780195062700
ISBN-10: 0195062701
Publication Date: 4/4/1991
Pages: 272
Rating:
  ?
0 stars, based on 0 rating
Publisher: Oxford University Press, USA
Book Type: Hardcover
Members Wishing: 0
Reviews: Amazon | Write a Review


Genres:


Back to the Top ↑
By using this Web site, you confirm that you have read, understood, and agreed to be bound by the Terms of Use. As an Amazon Associate we earn from qualifying purchases.
US Patent Number 7,877,315 | Copyright © 2004 - 2024 PaperBackSwap.com. All Rights Reserved.