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Silver Metallization: Stability and Reliability (Engineering Materials and Processes)
Silver Metallization Stability and Reliability - Engineering Materials and Processes
Author: Daniel Adams, Terry L. Alford, James W. Mayer
Silver has the lowest resistivity of all metals, which makes it an attractive interconnect material for higher current densities and faster switching speeds in integrated circuits. Over the past ten years, extensive research has been conducted to address the thermal and electrical stability, as well as processing issues which, to date, have prev...  more »
ISBN-13: 9781848000261
ISBN-10: 184800026X
Publication Date: 12/10/2007
Pages: 123
Edition: 1
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Publisher: Springer
Book Type: Hardcover
Members Wishing: 0
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