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Search - Test Methods for Measuring Conformance to Open Systems Interconnection (Osi) Abstract Data...... (IEEE Standard for Information Technology)

Test Methods for Measuring Conformance to Open Systems Interconnection (Osi) Abstract Data...... (IEEE Standard for Information Technology)
Test Methods for Measuring Conformance to Open Systems Interconnection Abstract Data - Osi - IEEE Standard for Information Technology
Author: IEEE, Institute of Electrical & Electronics En
ISBN-13: 9781559373081
ISBN-10: 1559373083
Pages: 94
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Publisher: Institute of Electrical & Electronics Enginee
Book Type: Paperback
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