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Thermal Testing of Integrated Circuits
Thermal Testing of Integrated Circuits
Author: J. Altet, Antonio Rubio
Temperature has been always considered as an appreciable magnitude to detect failures in electric systems. Abnormal status of this variable, both too high and too low, is sign of abnormal behavior in electronic systems. In Thermal Testing of Integrated Circuits the authors present the feasibility to consider temperature as an observable for...  more »
ISBN-13: 9781402070761
ISBN-10: 1402070764
Publication Date: 6/30/2002
Pages: 224
Edition: 1
Rating:
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Publisher: Springer
Book Type: Hardcover
Other Versions: Paperback
Members Wishing: 0
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