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Thermal Testing of Integrated Circuits
Thermal Testing of Integrated Circuits
Author:
Temperature has been always considered as an appreciable magnitude to detect failures in electric systems. In this book, the authors present the feasibility of considering temperature as an observable for testing purposes, with full coverage of the state of the art.
Author:
Temperature has been always considered as an appreciable magnitude to detect failures in electric systems. In this book, the authors present the feasibility of considering temperature as an observable for testing purposes, with full coverage of the state of the art.
ISBN-13: 9781441952875
ISBN-10: 144195287X
Publication Date: 3/31/2013
Pages: 224
Edition: 2002
Rating: ?
ISBN-10: 144195287X
Publication Date: 3/31/2013
Pages: 224
Edition: 2002
Rating: ?
0 stars, based on 0 rating
Publisher: Springer
Book Type: Paperback
Other Versions: Hardcover
Members Wishing: 0
Reviews: Amazon | Write a Review
Book Type: Paperback
Other Versions: Hardcover
Members Wishing: 0
Reviews: Amazon | Write a Review
Genres:
