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Thin Film Analysis by X-Ray Scattering
Thin Film Analysis by XRay Scattering
Author: Mario Birkholz
With contributions by Paul F. Fewster and Christoph Genzel — While X-ray diffraction investigation of powders and polycrystalline matter was at the forefront of materials science in the 1960s and 70s, high-tech applications at the beginning of the 21st century are driven by the materials science of thin films. Very much an interdisciplinary field...  more »
ISBN-13: 9783527310524
ISBN-10: 3527310525
Publication Date: 2/6/2006
Pages: 378
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Publisher: Wiley-VCH
Book Type: Hardcover
Members Wishing: 1
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