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Photo-induced Defects in Semiconductors (Cambridge Studies in Semiconductor Physics and Microelectronic Engineering)
Photoinduced Defects in Semiconductors - Cambridge Studies in Semiconductor Physics and Microelectronic Engineering
Author: David Redfield, Richard H. Bube
This book gives a complete overview of the properties of deep-level, localized defects in semiconductors. Such comparatively long-lived (or metastable) defects exhibit complex interactions with the surrounding material, and can significantly affect the performance and stability of certain semiconductor devices. After an introductory discussion o...  more »
ISBN-13: 9780521461962
ISBN-10: 0521461960
Publication Date: 1/26/1996
Pages: 240
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Publisher: Cambridge University Press
Book Type: Hardcover
Other Versions: Paperback
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